Journal article
IEEE Transactions on Information Forensics and Security, 2025, pp. 1-1
APA
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Liu, T., Yuan, X., Ke, W., Lam, C.-T., Im, S.-K., & Martins, P. (2025). A Symmetric Self-Embedding Mechanism for High-Fidelity Image Recovery Against Tampering. IEEE Transactions on Information Forensics and Security, 1–1. https://doi.org/10.1109/TIFS.2025.3638170
Chicago/Turabian
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Liu, Tong, Xiaochen Yuan, Wei Ke, Chan-Tong Lam, Sio-Kei Im, and Pedro Martins. “A Symmetric Self-Embedding Mechanism for High-Fidelity Image Recovery Against Tampering.” IEEE Transactions on Information Forensics and Security (2025): 1–1.
MLA
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Liu, Tong, et al. “A Symmetric Self-Embedding Mechanism for High-Fidelity Image Recovery Against Tampering.” IEEE Transactions on Information Forensics and Security, 2025, pp. 1–1, doi:10.1109/TIFS.2025.3638170.
BibTeX Click to copy
@article{liu2025a,
title = {A Symmetric Self-Embedding Mechanism for High-Fidelity Image Recovery Against Tampering},
year = {2025},
journal = {IEEE Transactions on Information Forensics and Security},
pages = {1-1},
doi = {10.1109/TIFS.2025.3638170},
author = {Liu, Tong and Yuan, Xiaochen and Ke, Wei and Lam, Chan-Tong and Im, Sio-Kei and Martins, Pedro}
}