Journal article
IEEE Transactions on Industrial Informatics, vol. 21, 2025, pp. 1299-1308
APA
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Liu, T., Yuan, X., Xie, Z., Zhao, K., Huang, G., & Pun, C.-M. (2025). A Two-Phase Scheme by Integration of Deep and Corner Feature for Balanced Copy-Move Forgery Localization. IEEE Transactions on Industrial Informatics, 21, 1299–1308. https://doi.org/10.1109/TII.2024.3476541
Chicago/Turabian
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Liu, Tong, Xiaochen Yuan, Zhiyao Xie, Kaiqi Zhao, Guoheng Huang, and Chi-Man Pun. “A Two-Phase Scheme by Integration of Deep and Corner Feature for Balanced Copy-Move Forgery Localization.” IEEE Transactions on Industrial Informatics 21 (2025): 1299–1308.
MLA
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Liu, Tong, et al. “A Two-Phase Scheme by Integration of Deep and Corner Feature for Balanced Copy-Move Forgery Localization.” IEEE Transactions on Industrial Informatics, vol. 21, 2025, pp. 1299–308, doi:10.1109/TII.2024.3476541.
BibTeX Click to copy
@article{liu2025a,
title = {A Two-Phase Scheme by Integration of Deep and Corner Feature for Balanced Copy-Move Forgery Localization},
year = {2025},
journal = {IEEE Transactions on Industrial Informatics},
pages = {1299-1308},
volume = {21},
doi = {10.1109/TII.2024.3476541},
author = {Liu, Tong and Yuan, Xiaochen and Xie, Zhiyao and Zhao, Kaiqi and Huang, Guoheng and Pun, Chi-Man}
}